Feature Adaptive Sampling for Scanning Electron Microscopy

“Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy

A new method for the image acquisition in scanning electron microscopy (SEM) was introduced. The method used adaptively increased pixel-dwell times to improve the signal-to-noise ratio (SNR) in areas of high detail. In areas of low detail, the electron dose was reduced on a per pixel basis, and a-posteriori image processing techniques were applied to remove the resulting noise. The technique wa...

High-precision scanning transmission electron microscopy at coarse pixel sampling for reduced electron dose

Determining the precise atomic structure of materials’ surfaces, defects, and interfaces is important to help provide the connection between structure and important materials’ properties. Modern scanning transmission electron microscopy (STEM) techniques now allow for atomic resolution STEM images to have down to sub-picometer precision in locating positions of atoms, but these high-precision t...

Scanning ultrafast electron microscopy.

Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200 keV, and the microscope operates in the transmission mode. Here, we report the development of scanning ultrafast electron microscopy using a f...

Flash Scanning Electron Microscopy

Scanning Electron Microscopy (SEM) is an invaluable tool for biologists and neuroscientists to study brain structure at the intracellular level. While able to image tissue samples with up to 5 nm isotropic resolution, image acquisition is prohibitively slow and limits the size of processed samples. In this work, we propose a novel approach to speeding up imaging when looking for specific struct...

Scanning Transmission Electron Microscopy for Nanostructure Characterization